BEGIN:VCALENDAR
PRODID:-//HKUST Drupal Platform//EN
VERSION:2.0
BEGIN:VTIMEZONE
TZID:Asia/Hong_Kong
BEGIN:STANDARD
DTSTART:20071104T020000
TZOFFSETFROM:+0700
TZOFFSETTO:+0800
TZNAME:HKT
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP;TZID=Asia/Hong_Kong:20260423T072917
DTSTART;TZID=Asia/Hong_Kong:20250626T100000
DTEND;TZID=Asia/Hong_Kong:20250626T130000
LOCATION: , HKUST
SUMMARY:MPhil in Electronic & Comp Engg - Understanding Cryogenic Characteristics of 2DFETs: An Experimental and Simulative Study of Overlooked Drain Degradation
UID:44057
END:VEVENT
END:VCALENDAR