BEGIN:VCALENDAR
PRODID:-//HKUST Drupal Platform//EN
VERSION:2.0
BEGIN:VTIMEZONE
TZID:Asia/Hong_Kong
BEGIN:STANDARD
DTSTART:20071104T020000
TZOFFSETFROM:+0700
TZOFFSETTO:+0800
TZNAME:HKT
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BEGIN:VEVENT
DTSTAMP;TZID=Asia/Hong_Kong:20260720T145840
DTSTART;TZID=Asia/Hong_Kong:20201218T090000
DTEND;TZID=Asia/Hong_Kong:20201218T120000
LOCATION:Scheduled Zoom Meeting: https://hkust.zoom.us/j/94907583747?pwd=NE9HNmxid1laQjY1NkVlNy81T1Y1dz09 (Meeting ID: 949 0758 3747, Passcode: 878145), HKUST
SUMMARY:PHD in Electronic & Comp Engg - Surface and Gate-Stack Trap States in GaN Lateral Power HEMT Devices: Physical Understandings and Reliability Enhancement
UID:27014
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END:VCALENDAR